CITATION INFORMATION

Title: Scanning electron microscopy images and energy dispersive X-ray spectroscopy of inclusions within AlSi10Mg mirrors created using additive manufacturing.

Principal Investigator: C. Atkins (UK ATC)
Co-Investigator: S. Tammas-Williams (Uni. of Edinburgh)
SEM operator: F. H. J. Laidlaw (Uni. of Edinburgh) 
Data collection: D. Westwood (Uni. of Edinburgh), I. Aziz (UK ATC), and Y. Chahid (UK ATC)
Resources: R. Snell (Uni. of Sheffield), and S. McPhee (UK ATC)
Photographs: C. Atkins & J. Cowan (UK ATC)

Year: 2025

Funder:	- UKRI Future Leaders Fellowship ‘Printing the future of space telescopes’ under grant # MR/T042230/1 
	- University of Edinburgh School of Engineering undergraduate summer placement scheme

One line summary: Data supporting the evaluation of inclusions that lead to scratches within mirrors fabricated using additive manufacturing in AlSi10Mg.

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LICENCE

CC-BY-NC   

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DATA OVERVIEW

All data within this deposit have not been editted and represent the output from the SEM or EDS.

DATA OVERVIEW - File hierarchy

01_DATA__SEM_EDX
	- S1_SEM_EDX
		- S1-1_SEM_EDX
			- 4x docx files, 2x .txt files, and 18x .tif files
		- S1-2_SEM_EDX
			- 1x docx file, and x6 .tif files
		- S1-3_SEM_EDX
			- 1x docx, and x2 .tif files
		- S1-4_SEM_EDX
			- 1x docx, and x2 .tif files
		- S1-5_SEM_EDX
			- 1x docx, and x4 .tif files
		- S1_digital_photograph.jpg

	- S2_SEM_EDX
		- S2-1_SEM_EDX
			- 1x docx file, 1x .txt file, and 3x .tif files
		- S2-2_SEM_EDX
			- 1x docx file, and 3x .tif files
		- S2-3_SEM_EDX
			- 1x docx file, 1x .txt file, and 6x .tif files		
		- S2-4_SEM_EDX
			- 2x docx files, 1x .txt file, and 12x .tif files	
		- S2_digital_photograph.jpg

	- S3_SEM_EDX
		- S3-1_SEM_EDX
			- 2x docx files, and 19x .tif files
		- S3-2_SEM_EDX
			- 1x docx file, and 5x .tif files
		- S3-3_SEM_EDX
			- 3x docx file, and 11x .tif files
		- S3-4_SEM_EDX
			- 1x docx file, and 4x .tif files
		- S3-5_SEM_EDX
			- 2x docx file, 5x .tif files
		- S3-6_SEM_EDX
			- 1x docx file, and 6x .tif files
		- S3-7_SEM_EDX
			- 1x docx file, 4x .tif files
		- S3-8_SEM_EDX
			- 1x docx file, and 2x .tif files
		- S3-9_SEM_EDX
			- 2x docx file2, and 2x .tif files
		- S3-10_SEM_EDX
			- 1x docx file, and 4x .tif files
		- S3-11_SEM_EDX
			- 2x docx files, and 4x .tif files
		- S3_digital_photograph.jpg

	- S4_SEM_EDX
		- S4-1_SEM_EDX
			- 2x docx files, and 10x .tif files
		- S4-2_SEM_EDX
			- 1x docx file, and 6x .tif files
		- S4-3_SEM_EDX
			- 2x docx files, and 10x .tif files
		- S4-4_SEM_EDX
			- 1x docx files, and 7x .tif files
		- S4-5_SEM_EDX	
			- 1x docx files, and 8x .tif files		
		- S4_digital_photograph.jpg

	- S5_SEM_EDX
		- S5-1_SEM_EDX
			- 2x docx files, and 12x .tif files
		- S5-2_SEM_EDX
			- 3x docx files, and 18x .tif files
		- S5-3_SEM_EDX
			- 1x docx file, and 2x .tif files
		- S5-4_SEM_EDX
			- 3x docx files, and 6x .tif files
		- S5-5_SEM_EDX
			- 1x docx file, and 3x .tif files
		- S5-6_SEM_EDX
			- 3x docx files, and 2x .tif files
		- S5-7_SEM_EDX
			- 1x docx file, and 2x .tif files
		- S5-8_SEM_EDX
			- 1x docx file, and 2x .tif files
		- S5_digital_photograph.jpg

	- S6_SEM_EDX
		- S6-1_SEM_EDX
			- 2x docx files, and 2x .tif files
		- S6-2_SEM_EDX
			- 2x docx files, and 4x .tif files
		- S6-3_SEM_EDX
			- 2x docx files, and 5x .tif files
		- S6-4_SEM_EDX
			- 3x docx file, and 15x .tif files
		- S6-5_SEM_EDX
			- 2x docx file, and 22x .tif files
		- S6_digital_photograph.jpg		


DATA OVERVIEW - File types

.docx - EDX maps of the SEM field of view
.docx - EDX spectrum/specta of defined areas or defined points
.txt - EDX spectrum/specta of defined areas
.tif - SEM or EDX images of the field of view
.jpg - photographs of the samples using a flash to emphasise the surface defects

DATA OVERVIEW - Acronyms & file nomenclature

SEM = scanning electron microscopy
EDX = Energy Dispersive X-ray Analysis
EDS = Energy Dispersive X-ray Spectroscopy
FIB = Focussed Ion-Beam Milling

S1 = Sample 1
S1-1 = Inclusion 1 within Sample 1
S1-1_EDX_01 = EDX map 1 of Inclusion 1 within Sample 1
S1-1_EDX_FIB_01 = EDX map 1 of the FIB region in Inclusion 1 within Sample 1
S1-1_EDX_FIB_01_Spectrum1 = Spectrum (or spectra) taken within the EDX FIB region of Inclusion 1 within Sample 1
S1-1_SEM_01 = SEM image 1 of Inclusion 1 within Sample 1

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METHODOLOGICAL - Samples

Samples
#	Manufacture year	Supplier	L-PBF machine		Materials used in L-PBF machine
S1	2022			Supplier 1	Aconity Lab		Multiple metals
S2	2024			Supplier 2	Concept Laser Mlabs	AlSi10Mg & Ti6Al4V
S3	2024			Supplier 2	EOS M290		AlSi10Mg & Ti6Al4V	
S4	2024			Supplier 3	SLM HL500		AlSi10Mg
S5*	2024			Supplier 2	EOS M290		AlSi10Mg & Ti6Al4V
S6*	2024			Supplier 3	SLM HL500		AlSi10Mg  

* Ceramic bead blasted prior to single point diamond turning

Sample Dimensions [nominal] - 50 mm dimeter, 5 - 10 mm thick
Sample Optical Prescription	- S1 flat 
				- S2 to S6 100 mm convex radius of curvature
Sample Material - AlSi10Mg

Sample Preparation: Additive manufacturing -> subtractive machining -> single point diamond turning 


METHODOLOGICAL - Evaluation

Location: School of Physics and Astronomy, University of Edinburgh
Equipment: Crossbeam 550 FIB-SEM; Zeiss, Germany
Detectors:	- InLens
		- SESI
		- ESB
		- BSD4
		- EDS
Electron voltage: 5keV -> 20keV (dependant on inclusion within field of view
			
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End of file