Browsing by Author "UKRI"

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    IR and 2D-IR data from "Distinctive signatures and ultrafast dynamics of Bronsted sites, silanol nests and adsorbed water in zeolites revealed by 2D-IR spectroscopy", Chemical Science , 2025
    (2025-03-15) Donaldson, Paul
    Data for the 2D-IR and FT-IR spectra shown in each Figure of the manuscript "Distinctive signatures and ultrafast dynamics of Bronsted sites, silanol nests and adsorbed water in zeolites revealed by 2D-IR spectroscopy", Donaldson, Hawkins and Howe, Chemical Science, 2025 The FT-IR spectra are in .csv format The 2D-IR spectra are in tab-separated variable format Refer to the .txt 'notes' in the main folder and each sub-folder for further information
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    Scanning electron microscopy images and energy dispersive X-ray spectroscopy of inclusions within AlSi10Mg mirrors created using additive manufacturing
    (2025-10) Atkins, Carolyn; Tammas-Williams, Samuel; Laidlaw, Fraser H. J.; Westwood, Dominic; Aziz, Ilhan; Chahid, Younes; Snell, Robert M.; McPhee, Scott; Cowan, Jason
    The data provided herein describes the evaluation of inclusions within the surfaces of six aluminium mirrors created using additive manufacturing in the alloy AlSi10Mg. The inclusions are frequently observed to cause scratches on the mirror surface and by identification, routes for mitigation can be provided. The inclusions were evaluated using scanning electron microscopy and energy dispersive X-ray spectroscopy and subsequently were observed to be either aluminium oxides or contaminating metal alloys. The mirrors utilised different additive manufacturing machines with different operation environments, which allow the data to inform on routes where contamination has occurred. The data are organised by sample (mirror) number and the evaluated inclusion, with individual files describing topography and spectroscopy. The mirrors were approx. 50 mm in diameter and between 5 and 10 mm in height. The equipment used was a Zeiss Crossbeam 550 FIB-SEM located at the University of Edinburgh. Five detectors on the FIB-SEM were used in data collection: InLens, SESI, ESD, BSD4 and EDS.