Effect of Rear Surface Electro-Static Fields on Hot, Refluxing and Escaping Electron Populations via PIC Simulations
| dc.contributor.author | Rusby, Dean | |
| dc.contributor.author | Neely, David | |
| dc.contributor.author | Armstrong, Chris | |
| dc.date.accessioned | 2018-12-11T18:50:01Z | |
| dc.date.available | 2018-12-11T18:50:01Z | |
| dc.date.issued | 2018 | |
| dc.description.abstract | The paper is a study of the refluxing and escaping electrons from a laser-solid interaction using the Particle in Cell code EPOCH. This dataset only includes the simulation input decks that is used in the paper as the results are many terabytes of data. | en_GB |
| dc.identifier.uri | http://purl.org/net/edata/handle/edata/746 | |
| dc.identifier.uri | http://dx.doi.org/10.5286/edata/721 | |
| dc.language.iso | en | en_GB |
| dc.relation.isreferencedby | https://doi.org/10.1017/hpl.2019.34 | |
| dc.rights | Creative Commons Attribution 4.0 International | |
| dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
| dc.subject.other | Laser Solid Interaction | en_GB |
| dc.subject.other | Refluxing Electrons | en_GB |
| dc.subject.other | Escaping Electrons | en_GB |
| dc.subject.other | Particle in Cell | en_GB |
| dc.title | Effect of Rear Surface Electro-Static Fields on Hot, Refluxing and Escaping Electron Populations via PIC Simulations | en_GB |
| dc.type | Dataset | en_GB |