Effect of Rear Surface Electro-Static Fields on Hot, Refluxing and Escaping Electron Populations via PIC Simulations

dc.contributor.authorRusby, Dean
dc.contributor.authorNeely, David
dc.contributor.authorArmstrong, Chris
dc.date.accessioned2018-12-11T18:50:01Z
dc.date.available2018-12-11T18:50:01Z
dc.date.issued2018
dc.description.abstractThe paper is a study of the refluxing and escaping electrons from a laser-solid interaction using the Particle in Cell code EPOCH. This dataset only includes the simulation input decks that is used in the paper as the results are many terabytes of data.en_GB
dc.identifier.urihttp://purl.org/net/edata/handle/edata/746
dc.identifier.urihttp://dx.doi.org/10.5286/edata/721
dc.language.isoenen_GB
dc.relation.isreferencedbyhttps://doi.org/10.1017/hpl.2019.34
dc.rightsCreative Commons Attribution 4.0 International
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.subject.otherLaser Solid Interactionen_GB
dc.subject.otherRefluxing Electronsen_GB
dc.subject.otherEscaping Electronsen_GB
dc.subject.otherParticle in Cellen_GB
dc.titleEffect of Rear Surface Electro-Static Fields on Hot, Refluxing and Escaping Electron Populations via PIC Simulationsen_GB
dc.typeDataseten_GB

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